Method to evaluate the presence of a source of x-ray beam inhomogeneity during x-ray exposure
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United States of America Patent
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Aug 22, 2017
Grant Date -
May 28, 2015
app pub date -
Jun 5, 2013
filing date -
Jun 11, 2012
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Abstract
A statistical analysis is performed on pixel values of at least one region of interest in an image obtained by substantially uniform irradiation of an x-ray detector and deciding upon the presence of a source of x-ray beam in-homogeneity by comparing the results of the statistical analysis with at least one predetermined acceptance criterion.
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International Classification(s)
- H04N:PICTORIAL COMMUNICATION, e.g. TELEVISION
- G06T:IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G01N:INVESTIGATING OR ANALYSING MATERIALS BY DETERMININ....
- A61B:DIAGNOSIS; SURGERY; IDENTIFICATION
- G01T:MEASUREMENT OF NUCLEAR OR X-RADIATION
- G06K:RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD ....
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