Semiconductor test device and method of operating the same

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United States of America Patent

PATENT NO 9720034
APP PUB NO 20150192638A1
SERIAL NO

14590135

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Abstract

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A method of operating a semiconductor test device includes transferring a first device under test (DUT) from a load tray to a first load shuttle. The first DUT is transferred from the first load shuttle to a first test board and a second DUT is transferred from the load tray to a second load shuttle.

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Patent Owner(s)

Patent OwnerAddress
SAMSUNG ELECTRONICS CO LTDGYEONGGI DO SOUTH KOREA GYEONGGI-DO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Jung, Suk Hyun Gyeonggi-do, KR 1 1

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