Automated test platform for testing short circuits
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United States of America Patent
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Aug 1, 2017
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app pub date -
Mar 31, 2015
filing date -
Mar 31, 2015
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Abstract
An automated test platform for testing a first device under test includes N voltage sources for providing N different voltages. A cross matrix switching system is coupled to the N voltage sources, the cross matrix switch being configured to provide the N different voltages to M discrete test points within the first device under test, wherein M is larger than N. An N voltage measuring system is coupled to the first device under test, the N voltage measuring system being configured to measure the voltage potential present on the M discrete test points.
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