Method for analyzing ionic structure
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United States of America Patent
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Jul 25, 2017
Grant Date -
Aug 25, 2016
app pub date -
Sep 5, 2014
filing date -
Sep 5, 2014
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Abstract
A method for analyzing ionic structure, including: applying a radio frequency electric field on an ion mass analyzer to cause sample ions to be excited to a motion amplitude, the motion amplitude at this moment being recorded as a primary motion amplitude; continuously feeding carrier gas into the ion mass analyzer and keeping a certain degree of vacuum in the ion mass analyzer, the sample ions being collided with the carrier gas and the motion amplitude being decreased gradually, and collecting a time domain signal of an image current generated by the sample ions during the process; and analyzing the time domain signal through a time-frequency analysis method and obtaining time-varying characteristic curves indicating corresponding relations between the motion frequencies of the ions having corresponding sizes and the collision cross sectional areas of the ions and the carrier gas, thus distinguishing among ions having different sizes.
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