System and method for measuring an object using X-ray projections
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United States of America Patent
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Jul 18, 2017
Grant Date -
Mar 31, 2016
app pub date -
Sep 22, 2015
filing date -
Sep 30, 2014
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Abstract
An apparatus and method of measuring an object (having at least two edges) projects a plurality of x-ray images of the object. At least two of the plurality of x-ray images are projected from different directions relative to the object. The apparatus and method also locate the at least two edges in the x-ray images, and ray trace a plurality of lines. Each ray traced line is tangent to at least one point on at least one of the located edges. Next, the apparatus and method reconstruct at least a partial wireframe model of the object from the tangent points of the ray traced lines. The wireframe model includes the at least two edges. Finally, the apparatus and method measure between the at least two edges of the at least partial wireframe model.
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