Dispatch control method for furnace process

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United States of America Patent

PATENT NO 9709335
SERIAL NO

14510122

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Abstract

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A dispatch control method for a furnace process including the following steps is provided. Before a plurality of lots of wafers is loaded into a furnace, the characteristic variation value of each of the plurality of lots of wafers is calculated. The plurality of lots of wafers is ordered according to the size of the characteristic variation values. The plurality of lots of wafers is placed in the furnace in a descending order of the characteristic variation values corresponding to a plurality of locations in the furnace causing the characteristic variation values to change from smaller to larger.

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Patent Owner(s)

Patent OwnerAddress
POWERCHIP SEMICONDUCTOR MANUFACTURING CORPORATIONHSINCHU

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Chien-Chung Hsinchu, TW 159 1040
Hsiao, Shih-Tsung Hsinchu, TW 4 8
Wu, Jyun-Da Taoyuan County, TW 5 13

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