Test method and system for cut-in voltage
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jul 4, 2017
Grant Date -
Nov 26, 2015
app pub date -
Dec 31, 2013
filing date -
Jan 23, 2013
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A test method and system for cut-in voltage. The method comprises: coarse scanning of the cut-in voltage: a grid voltage, i.e., the cut-in voltage, is quickly determined when a drain terminal current is greater than a target current for the first time (100); accurate scanning of the cut-in voltage: a scanning step length is shortened continuously until the scanning step length is shorter than a preset step length, and each time the scanning step length is shortened, the scanning is conducted according to the current shortened scanning step length on the basis of the cut-in voltage determined in the former time, and then the cut-in voltage under the condition of the current shortened scanning step length is determined again (200). The scanning voltage is automatically increased or decreased by the test method and system through adding high resolution and high precision test conversion into a second scanning test, and therefore the testing of the cut-in voltage becomes more efficient and more accurate.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully