Method for analysis of sample and apparatus therefor

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United States of America Patent

PATENT NO 9691594
APP PUB NO 20160189944A1
SERIAL NO

14890512

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Abstract

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A thermal analysis step, a molecule ionization step and a molecular structure analysis step are executed in parallel to a temperature increasing step. In the molecule ionization step, component molecules contained in gas evolved from a sample S due to temperature increase are ionized, and in the molecular structure analysis step, any selected ion out of molecular ions obtained in the molecule ionization step is dissociated to generate fragment ions corresponding to the structural factors of the molecule, and the structure of the molecule is analyzed on the basis of the fragment ions.

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Patent Owner(s)

Patent OwnerAddress
RIGAKU CORPORATION3-9-12 MATSUBARA-CHO AKISHIMA-SHI TOKYO 196-8666

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Arii, Tadashi Tokyo, JP 9 44
Matsushima, Koichi Tokyo, JP 1 3
Otake, Satoshi Tokyo, JP 38 379

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