Automatic gain tuning in atomic force microscopy
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United States of America Patent
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Jun 27, 2017
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May 27, 2011
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May 27, 2011
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Abstract
A method for optimizing loop gain of an atomic force microscope (AFM) apparatus includes determining a change in gain of the physical system and adjusting a controller frequency response of the controller in an AFM loop to compensate for the determined change in gain. The AFM loop has a corresponding loop response that includes the product of the controller frequency response and a physical system response of the physical system.
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