Method and apparatus for estimating the temperature of a semiconductor chip
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United States of America Patent
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Jun 27, 2017
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Aug 13, 2012
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Sep 7, 2011
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Abstract
The invention regards a method for estimating the temperature of a semiconductor chip accommodated in a power semiconductor device in operation, such as an IGBT power module, the method comprising the steps of; while the power semiconductor device is in operation determining a voltage drop over the power semiconductor device for a value of applied load current and; estimating the temperature of the semiconductor chip by evaluating the relationship between the determined voltage drop and the value of applied load current on the basis of a semiconductor chip temperature model. The invention also regards the corresponding apparatus for estimating the temperature of a semiconductor chip, as well as a wind turbine comprising such an apparatus.
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