Non-destructive readout ferroelectric memory as well as method of preparing the same and method of operating the same
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United States of America Patent
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Jun 20, 2017
Issued Date -
N/A
app pub date -
Jun 26, 2015
filing date -
Jan 24, 2015
priority date (Note) -
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Abstract
A non-destructive readout ferroelectric memory as well as a method of preparing the ferroelectric memory and a method of operating the ferroelectric memory are disclosed. The ferroelectric memory comprises a ferroelectric thin film layer. The ferroelectric memory of the invention can realize a non-destructive readout by way of current, is suitable for a high density application, is simple in preparation and has a low cost.
First Claim
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Family

- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
FUDAN UNIVERSITY | 200433 NO 220 HANDAN ROAD SHANGHAI YANGPU DISTRICT SHANGHAI CITY SHANGHAI CITY 200433 |
International Classification(s)
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Bai, Zilong | Shanghai, CN | 2 | 9 |
# of filed Patents : 2 Total Citations : 9 | |||
Geng, Wenping | Shanghai, CN | 3 | 14 |
# of filed Patents : 3 Total Citations : 14 | |||
Jiang, Anquan | Shanghai, CN | 8 | 25 |
# of filed Patents : 8 Total Citations : 25 | |||
Jiang, Jun | Shanghai, CN | 241 | 1253 |
# of filed Patents : 241 Total Citations : 1253 |
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- 3 Citation Count
- H01L Class
- 18.50 % this patent is cited more than
- 8 Age
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