Contact spring for a testing base for the high current testing of an electronic component
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United States of America Patent
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Jun 6, 2017
Grant Date -
Apr 24, 2014
app pub date -
Oct 22, 2013
filing date -
Oct 24, 2012
priority date (Note) -
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Abstract
A contact spring for a testing base for high current testing of an electronic component, which is produced from a spring metal sheet of a predetermined thickness and possesses two identical opposing lateral faces, and which has a spring arm and a testing arm with a testing tip, where the testing arm forms an angle with the spring arm, which enables the testing tip to be positioned on a contact surface of the electronic component running approximately parallel to the spring arm, by relative movement between the testing base and the electronic component.
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