Systems and methods for testing circuitry programmability
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United States of America Patent
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May 30, 2017
Grant Date -
Jun 6, 2013
app pub date -
Dec 1, 2011
filing date -
Dec 1, 2011
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Abstract
Systems and methods in which circuitry programmability is tested through observing a change in voltage on a circuit node that is affected by the programmability under test. For example, one or more particular circuit node may be identified at which some measurable change in voltage occurs upon a change in state of a programmable circuit under test (PCUT). Thus, by detecting a change in voltage at such a circuit node in association with a programmable state change, embodiments may determine that respective circuit programmability is functional. Test circuitry of embodiments provides for circuitry programmability testing, through observing a change in voltage on a circuit node that is affected by the programmability under test, suitable for testing digital programmability which is deeply embedded in analog circuitry.
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