Analog to digital converter with high precision offset calibrated integrating comparators
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United States of America Patent
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May 23, 2017
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app pub date -
Sep 22, 2016
filing date -
Nov 13, 2015
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Abstract
An analog-to-digital converter includes a plurality of slave sampler multiplexers responsive to outputs of a master sampler that receives analog signals and whose output ports connect to integrating threshold comparators having capacitive digital-to-analog conversion offset adjustments for forming an analog-to-thermometer code conversion. A calibration state machine receives outputs of each of the integrating threshold comparators to control the capacitive digital-to-analog conversion offset adjustment of every integrating threshold comparator and to control a calibration digital-to analog converter. A thermometer code to binary code logic decoder receives outputs of each of the integrating threshold comparators and outputs digital samples.
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