Method of studying a sample in an ETEM
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United States of America Patent
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May 23, 2017
Grant Date -
Feb 14, 2013
app pub date -
Aug 3, 2012
filing date -
Aug 3, 2011
priority date (Note) -
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Abstract
A method and apparatus is provided for studying the reaction (chemical or physical) of a sample with a gas in the active atmosphere of an instrument such as an Environmental Transmission Electron Microscope (ETEM), optical microscope, X-ray microscope or scanning probe microscope. The sample is exposed to inert gas at a desired temperature before exchanging the inert gas to the active gas to reduce to avoid, or at least minimize, sample drift during image acquisition.
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