X-ray topography apparatus

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United States of America Patent

PATENT NO 9658174
APP PUB NO 20150146858A1
SERIAL NO

14538837

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Abstract

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Disclosed is an X-ray topography apparatus including an X-ray source, a multilayer film mirror, a slit, a two-dimensional X-ray detector, and a sample moving device that sequentially moves the sample to a plurality of step positions. The X-ray source is a minute focal spot. The multilayer film mirror forms monochromatic, collimated, high-intensity X-rays. The direction in which the multilayer film mirror collimates the X-rays coincides with the width direction of the slit. The step size by which the sample is moved is smaller than the width of the slit. The combination of the size of the minute focal spot, the width of the slit, and the intensity of the X-rays that exit out of the multilayer film mirror allows the contrast of an X-ray image produced when the detector receives X-rays for a predetermined period of 1 minute or shorter to be high enough for observation of the X-ray image.

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Patent Owner(s)

Patent OwnerAddress
RIGAKU CORPORATION3-9-12 MATSUBARA-CHO AKISHIMA-SHI TOKYO 196-8666

International Classification(s)

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  • 2014 Application Filing Year
  • G21K Class
  • 330 Applications Filed
  • 266 Patents Issued To-Date
  • 80.61 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances201420152016201720182019202020210255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fujimura, Takeshi Akiruno, JP 31 270
Kiku, Atsunori Hino, JP 2 55
Morikawa, Keiichi Fuchu, JP 9 142
Omote, Kazuhiko Akiruno, JP 55 578
Tsuchiya, Masahiro Tachikawa, JP 142 1067
Ueji, Yoshinori Akishima, JP 12 79

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Patent Citation Ranking

  • 9 Citation Count
  • G21K Class
  • 17.50 % this patent is cited more than
  • 8 Age
Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges421642841101 - 1011 - 2021 - 3031 - 4051 - 600102030405060708090100110120130140150160170180

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