System and method for detecting unknown materials using short wave infrared hyperspectral imaging
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United States of America Patent
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May 23, 2017
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Feb 4, 2013
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Apr 5, 2010
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Abstract
A system and method for analyzing unknown materials on surfaces including, but not limited to, chemical materials, biological materials, hazardous materials, drug materials, and non-threat materials using SWIR and/or extended range SWIR hyperspectral and spectroscopic techniques. A system comprising a collection optics, a tunable filter, and a first detector for generating a test data set representative of the unknown sample. A second detector, comprising a visible imaging device, may be configured to operate in a scanning mode to locate areas of interest for further interrogation using SWIR. A method comprising generating a SWIR test data set representative of the unknown sample and analyzing the unknown sample to detect, identify and/or distinguish an unknown material as a known material. This analysis may be achieved by comparing the test data set to a reference data set using at least one chemometric technique.
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