Component measurement system having wavelength filtering
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United States of America Patent
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May 23, 2017
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N/A
app pub date -
Oct 23, 2014
filing date -
Oct 23, 2014
priority date (Note) -
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Abstract
A system is disclosed for use in measuring a component. The system may have a probe configured to generate signals associated with a proximity to actual target points of the component, an actuator configured to move the probe relative to the component, and a controller in communication with the probe and the actuator. The controller may be configured to receive coordinates of intended form target points, to determine coordinates of the actual target points of the component relative to a component datum based on the signals, and to make a comparison of the coordinates of the intended form target points and the coordinates of the actual target points. The controller may also be configured to generate a deviation report based on the comparison, and to filter information from the deviation report according to wavelength into a plurality of deviation categories corresponding to component specification requirements of the component.
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