Charged particle beam system and method of operating a charged particle beam system

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 9640364
APP PUB NO 20160104598A1
SERIAL NO

14969352

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The present disclosure relates to a gas field ion source comprising a housing, an electrically conductive tip arranged within the housing, a gas supply for supplying one or more gases to the housing, wherein the one or more gases comprise neon or a noble gas with atoms having a mass larger than neon, and an extractor electrode having a hole to permit ions generated in the neighborhood of the tip to pass through the hole. A surface of the extractor electrode facing the tip can be made of a material having a negative secondary ion sputter rate of less than 10−5 per incident neon ion.

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Patent Owner(s)

Patent OwnerAddress
CARL ZEISS MICROSCOPY LLCONE ZEISS DRIVE THORNWOOD NY 10594

International Classification(s)

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  • 2015 Application Filing Year
  • H01J Class
  • 2290 Applications Filed
  • 1843 Patents Issued To-Date
  • 80.49 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances20152016201720182019202020212022202320240255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Huang, Weijie North Reading, US 22 75
McVey, Shawn Newton, US 9 106
Notte,, IV John A Gloucester, US 46 887
Rahman, FHM-Faridur North Andover, US 7 51

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Patent Citation Ranking

  • 1 Citation Count
  • H01J Class
  • 25.25 % this patent is cited more than
  • 8 Age
Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges6221535185612511122323201 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +010020030040050060070080090010001100120013001400150016001700

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