System for eye examination by means of stress-dependent parameters
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United States of America Patent
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Apr 25, 2017
Grant Date -
Jul 7, 2016
app pub date -
Dec 11, 2015
filing date -
Dec 12, 2014
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Abstract
The present disclosure relates to a system for examining an eye. The system comprises a microscopy system for generating an image plane image of an object region. An OCT system of the system is configured to acquire OCT data from the object region which reproduce the object region in different stress states. A data processing unit of the system is configured to determine at least one value of a stress-dependent parameter, depending on the OCT data. The system generates an output image that is dependent on the image plane image and is furthermore dependent on the stress-dependent parameter.
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