Method for measuring an angle between two spatially separated elements
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United States of America Patent
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Apr 18, 2017
Grant Date -
Jan 1, 2015
app pub date -
Jan 16, 2013
filing date -
Jan 17, 2012
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Abstract
Some embodiments of the invention relate to a method for measuring an angle between two spatially separated elements having the steps: preparing a multiplex hologram having a plurality of interference patterns, at least two having different angles of incidence of an object light wave onto a hologram plane; arranging the multiplex hologram in a first element plane on a first element; lighting the multiplex hologram with a reference light wave; arranging a light detector in a second element plane on a second element; detecting a reference light wave refracted on an interference pattern with a light detector; creating an intensity pattern from the detected refracted reference light wave; assigning the angle of incidence stored as machine readable data to the intensity pattern; and/or calculating an angle between the first element plane and the second element plane from the assigned angle of incidence.
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