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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
RIGAKU CORPORATION	3-9-12 MATSUBARA-CHO AKISHIMA-SHI TOKYO 196-8666

International Classification(s)

• G01N:INVESTIGATING OR ANALYSING MATERIALS BY DETERMININ....
• G01T:MEASUREMENT OF NUCLEAR OR X-RADIATION

• 2013 Application Filing Year
• G01N Class
• 9056 Applications Filed
• 7640 Patents Issued To-Date
• 84.37 % Issued To-Date

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Nishi, Kunio	Hachioji, JP	6	53
# of filed Patents : 6 Total Citations : 53
Ohara, Takao	Ome, JP	8	33
# of filed Patents : 8 Total Citations : 33
Ozawa, Tetsuya	Hino, JP	41	274
# of filed Patents : 41 Total Citations : 274
Wakasaya, Kenji	Akishima, JP	3	10
# of filed Patents : 3 Total Citations : 10

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Patent Citation Ranking

• 1 Citation Count
• G01N Class

• 33.94 % this patent is cited more than
• 8 Age

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date
11.5 Year Payment	$7400.00	$3700.00	$1850.00	Oct 11, 2028

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge - 11.5 year - Late payment within 6 months	$160.00	$80.00	$40.00
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
April 11, 2017	US,9618461,B2   US9618461B2	GRANTED PATENT AS SECOND PUBLICATION
April 17, 2014	US,20140105368,A1   US20140105368A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent No: 9618461

X-ray analysis apparatus

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Abstract

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An X-ray analysis apparatus for detecting, using an X-ray detector, X-rays given off by a sample when the sample is irradiated with X-rays, the X-ray analysis apparatus having replaceable components. The X-ray analysis apparatus comprises labels attached to the replaceable components and including symbols indicating the types of replaceable components, a camera for photographing the replaceable components and the labels, and CPU and image recognition software for specifying the types of replaceable components by calculation based on the symbols in the labels.

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Description

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Claims

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Legal Events

 

• MAFP2024
• MAFP2020
• I2017
• STCF2017
• P2014
• F2013
• AS2013
• PD2012

Date	Code	Event	Description
Oct 02, 2024	MAFP	MAINTENANCE FEE PAYMENT	free format text: PAYMENT OF MAINTENANCE FEE, 8TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1552); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY year of fee payment: 8
Sep 18, 2020	MAFP	MAINTENANCE FEE PAYMENT	free format text: PAYMENT OF MAINTENANCE FEE, 4TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1551); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY year of fee payment: 4
Apr 11, 2017	I	Issuance
Mar 22, 2017	STCF	INFORMATION ON STATUS: PATENT GRANT	free format text: PATENTED CASE
Apr 17, 2014	P	Published
Oct 10, 2013	F	Filing
Aug 13, 2013	AS	ASSIGNMENT	free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:OHARA, TAKAO;WAKASAYA, KENJI;OZAWA, TETSUYA;AND OTHERS;REEL/FRAME:031381/0170 Owner name: RIGAKU CORPORATION, JAPAN Effective Date: Aug 13, 2013
Oct 11, 2012	PD	Priority Date