Systems and methods for time/frequency indexed pulse calibrations for vector network analyzers

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United States of America Patent

PATENT NO 9606212
SERIAL NO

14213134

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Abstract

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A method for measuring scattering parameters in a device under test (DUT) using a vector network analyzer (VNA), includes calibrating the VNA to generate corrections for deterministic setup defects and mapping a plurality of error terms based on a plurality of time indices, wherein each time indicia is associated with an error term. A test signal is transmitted to the DUT to obtain a measurement signal from the DUT in response to the test signal. The generated corrections to obtained measurements are time aligned based on the mapped error terms.

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ANRITSU COMPANY490 JARVIS DRIVE MORGAN HILL CA 95037

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  • 2014 Application Filing Year
  • G01R Class
  • 4836 Applications Filed
  • 4099 Patents Issued To-Date
  • 84.77 % Issued To-Date
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Inventor Name Address # of filed Patents Total Citations
Martens, Jon S San Jose, US 30 717

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  • 20 Citation Count
  • G01R Class
  • 83.16 % this patent is cited more than
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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges400170425163241623181358501 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +0100200300400500600700800900100011001200130014001500160017001800

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