Systems and methods for time/frequency indexed pulse calibrations for vector network analyzers
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United States of America Patent
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Mar 28, 2017
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Mar 14, 2014
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Mar 15, 2013
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Abstract
A method for measuring scattering parameters in a device under test (DUT) using a vector network analyzer (VNA), includes calibrating the VNA to generate corrections for deterministic setup defects and mapping a plurality of error terms based on a plurality of time indices, wherein each time indicia is associated with an error term. A test signal is transmitted to the DUT to obtain a measurement signal from the DUT in response to the test signal. The generated corrections to obtained measurements are time aligned based on the mapped error terms.
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