Aging detection circuit and method thereof
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United States of America Patent
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Mar 28, 2017
Grant Date -
Oct 22, 2015
app pub date -
Oct 28, 2014
filing date -
Apr 18, 2014
priority date (Note) -
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Abstract
An aging detection circuit is provided. The aging detection circuit is configured on a chip and includes a testing circuit and an aging signal generation circuit. The testing circuit is electrically coupled to the aging signal generation circuit. The testing circuit generates an output signal. The aging signal generation circuit includes a signal generation circuit and a selection circuit. The signal generation circuit generates multiple input signals having different frequencies. The selection circuit selectively outputs one of the input signals as an aging signal to an input terminal of the testing circuit or feeds back the output signal generated by the testing circuit to the input terminal of the testing circuit.
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