Sequential wafer bonding

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United States of America Patent

PATENT NO 9604844
SERIAL NO

14804110

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Abstract

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Embodiments of a sensor device include a sensor substrate and a first cap substrate attached to the sensor substrate with a first bond material. The first bond material is arranged to define a first device cavity. A second cap substrate is attached to the sensor substrate with a second bond material. The second bond material is arranged to define a second device cavity. The second bond material has a lower bonding temperature than the first bond material. The second cap substrate is further secured to the sensor substrate by an adhesive material disposed between the sensor substrate and the second cap substrate.

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Patent Owner(s)

Patent OwnerAddress
NXP USA INC6501 WILLIAM CANNON DRIVE WEST AUSTIN TX 78735

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bowles, Philip H Gilbert, US 28 472
Hooper, Stephen R Mesa, US 54 681

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