Systems and methods for measuring current with shielded conductors
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United States of America Patent
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Mar 21, 2017
Grant Date -
May 21, 2015
app pub date -
Dec 3, 2013
filing date -
Nov 18, 2013
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Abstract
Systems and methods for measuring current with shielded conductors are provided. One system includes a first wire within shielding, wherein the first wire is connected between a high voltage source and a filament of an x-ray system. The system also includes a second wire within shielding, wherein the second wire is connected between the high voltage source and the x-ray system and the shielding of the first and second wires is at a high voltage potential of the x-ray system. The system further includes a measurement resistor at a high voltage potential, wherein the measurement resistor is connected between the shielding and one of the first or second wires.
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