Test arrangement
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United States of America Patent
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Mar 14, 2017
Grant Date -
Jul 16, 2015
app pub date -
Dec 30, 2014
filing date -
Jan 10, 2014
priority date (Note) -
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Abstract
A test arrangement for use in determining the location of a fault in an installation 10 comprising at least first and second conductors 22, 24 providing electrical connections between a surface located device 12 and a subsea located device 20, the test arrangement comprising a first module 26 operable to apply a common test signal between ground and the first and second conductors 22, 24, and a second module 28 operable to monitor the total current flowing through the first and second conductors 22, 24 at a subsea location.
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