Measurement apparatus and method of measurement
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United States of America Patent
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Mar 7, 2017
Grant Date -
Oct 15, 2015
app pub date -
Apr 7, 2015
filing date -
Apr 14, 2014
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Abstract
A measurement apparatus includes a measuring unit that carries out a potential measuring process that measures potential at measured positions on a surface of a laminated body, in which a plurality of plate-like or film-like component parts with different physical properties have been laminated, in a state where an electrical signal has been supplied to the surface, and a processing unit that carries out a computational process, which has been decided in advance, using measurement values of the potential that have been measured by the potential measuring process to find an interfacial resistance of an interface between the component parts in the laminated body.
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