Optical film defect detection method and system thereof
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United States of America Patent
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Feb 28, 2017
Grant Date -
Jan 5, 2017
app pub date -
Dec 11, 2015
filing date -
Jul 3, 2015
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Abstract
An optical defect detection method and a system thereof are disclosed. The detection method includes a process of detecting an image of an optical film by an optical detector. The image is converted into a clean detection image by conducting the following processes: uniforming the brightness, enhancing the contrast, filtering off the noise, smoothing the image and binarizing the image. A relative relation between a pixel and the surrounding pixels of the clean detection image is converted into a spatial relation sequence model. The spatial relation sequence model is compared to the different types of the defect sequence model, so that the defect type of the optical film is identified as a point defect, a lack of material defect or a ripple defect.
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