Modular atomic force microscope with environmental controls

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 9581616
SERIAL NO

14817517

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures.

First Claim

See full text

Other Claims data not available

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
OXFORD INSTRUMENTS ASYLUM RESEARCH INCGOLETA CA

International Classification(s)

loading....
  • 2015 Application Filing Year
  • G01Q Class
  • 101 Applications Filed
  • 89 Patents Issued To-Date
  • 88.12 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances20152016201720182019202020210255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cleveland, Jason Ventura, US 45 304
Hodgson, Jim Santa Barbara, US 3 5
Proksch, Roger Santa Barbara, US 57 377
Rutgers, Maarten Los Angeles, US 9 47
Viani, Mario Santa Barbara, US 10 51

Cited Art Landscape

Load Citation

Patent Citation Ranking

  • 0 Citation Count
  • G01Q Class
  • 0 % this patent is cited more than
  • 8 Age
Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges11 - 1000.050.10.150.20.250.30.350.40.450.50.550.60.650.70.750.80.850.90.9511.05

Forward Cite Landscape

Load Citation

Maintenance Fees

Fee Large entity fee small entity fee micro entity fee due date
11.5 Year Payment $7400.00 $3700.00 $1850.00 Aug 28, 2028