Stimulated emission depletion microscopy
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United States of America Patent
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Feb 21, 2017
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Aug 16, 2013
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Aug 23, 2012
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Abstract
Aberrations in stimulated emission depletion microscopy are corrected using an adaptive optics approach using a metric which combines both image sharpness and brightness. Light modulators (22,32) are used to perform aberration correction in one or more of the depletion path (10), the excitation path (12), or the emission path from sample to detector.
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