Semiconductor device and method of direct measurement and acquisition of MEMS employing sigma-delta loop
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United States of America Patent
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Feb 21, 2017
Grant Date -
Sep 18, 2014
app pub date -
Jan 21, 2014
filing date -
Mar 15, 2013
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Abstract
A semiconductor device measures a state of a MEMS as a first voltage variation at a sensing node. The state of the MEMS includes a capacitance. A first capacitor is coupled between the sensing node and an input of an integrator for transferring the first voltage variation to a second node as a first signal. A second voltage variation is routed through a second capacitor to the second node as a second signal. The integrator integrates the first signal and second signal to provide an integrated signal. An ADC has an input coupled to an output of the integrator and converts the integrated signal to a digital signal representative of the capacitance of the MEMS. A DAC has an input coupled to the output of the ADC. A second capacitor is coupled between an output of the DAC and the sensing node.
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