Force detection for microscopy based on direct tip trajectory observation

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United States of America Patent

PATENT NO 9562927
APP PUB NO 20160124014A1
SERIAL NO

14872332

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Abstract

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With example embodiments described herein, a probe tip of a scanning probe microscope (such as an atomic force microscope (AFM)) is directly detected as it moves in a tapping mode to determine the tip positions over time, and a force for the tip is computed from these determined tip positions.

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Patent Owner(s)

Patent OwnerAddress
THE CURATORS OF THE UNIVERSITY OF MISSOURI316 UNIVERSITY HALL COLUMBIA MO 65211

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
King, Gavin McLean Columbia, US 1 1
Sigdel, Krishna Prasad Columbia, US 1 1

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