Tester having an application specific electronics module, and systems and methods that incorporate or use the same
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United States of America Patent
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Jan 31, 2017
Grant Date -
May 22, 2014
app pub date -
Oct 29, 2010
filing date -
Oct 29, 2010
priority date (Note) -
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Abstract
In one embodiment, an automated test equipment (ATE) system includes a tester having a tester electronics module, an application specific electronics module, and a tester-to-device under test (DUT) interface mount. The tester electronics module has a first electronics interface configured to electrically connect to a tester-to-DUT interface when the tester-to-DUT interface is coupled to the tester-to-DUT interface mount. The application specific electronics module has a second electronics interface and a third electronics interface. The second and third electronics interfaces are configured to electrically connect to the tester-to-DUT interface when the tester-to-DUT interface is coupled to the tester-to-DUT interface mount. The application specific electronics module is configured to communicate with the tester electronics module via the second electronics interface, and with at least one DUT via the third electronics interface.
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