Alignment inspecting system for liquid crystal substrate
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United States of America Patent
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Jan 17, 2017
Grant Date -
Nov 12, 2015
app pub date -
Jan 14, 2014
filing date -
Dec 31, 2013
priority date (Note) -
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Abstract
The present invention relates to an alignment inspecting system for liquid crystal substrate, comprises an alignment mechanism located on corners of the substrate, and the alignment mechanism including a horizontal alignment device for exerting pressure to edges of the substrate, wherein a flattening device for applying longitudinal pressure to the substrate is further included. The present invention can be concluded with the following advantages: this alignment inspecting system for liquid crystal substrate can be used to correct the bending of the substrate during alignment process, so as to reduce the bending and deformation of the substrate which in turn creates poor contact between the probe and the substrate. As a result, incorrect reading can be avoided.
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