Vertical hall sensors with reduced offset error
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United States of America Patent
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Jan 10, 2017
Grant Date -
Apr 21, 2016
app pub date -
Oct 21, 2015
filing date -
Oct 21, 2014
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Abstract
A semiconductor chip for measuring a magnetic field based on the Hall effect. The semiconductor chip comprises an electrically conductive well having a first conductivity type, in a substrate having a second conductivity type. The semiconductor chip comprises at least four well contacts arranged at the surface of the well, and having the first conductivity type. The semiconductor chip comprises a plurality of buffer regions interleaved with the well contacts and having the first conductivity type. The buffer regions are highly conductive and the buffer region dimensions are such that at least part of the current from a well contact transits through one of its neighboring buffer regions.
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