Analyzing apparatus

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United States of America Patent

PATENT NO 9536720
APP PUB NO 20130299694A1
SERIAL NO

13881915

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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There is provided an analyzing apparatus including an irradiation unit irradiating a first point with a laser, a convergence unit causing an analysis target to converge at the first point, and a unit analyzing a sample gas including a substance that has been irradiated with the laser at the first point using an ion mobility sensor. One example of the convergence unit includes a unit causing the analysis target to be captured in a carrier substance in a liquid state; and a discharging unit discharging the carrier substance including the analysis target to the first point.

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Patent Owner(s)

Patent OwnerAddress
ATONARP INC1-10-18 SHIBADAIMON MINATO-KU TOKYO 105-0012

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Imai, Akira Tsukuba, JP 185 2022
Sato, Tomoyoshi Tsukuba, JP 28 235

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