Signal detection circuit and scanning probe microscope
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United States of America Patent
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Jan 3, 2017
Grant Date -
Feb 18, 2016
app pub date -
Mar 4, 2014
filing date -
Mar 28, 2013
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Abstract
A signal detection circuit includes: a VCO that generates a reference signal; a complex signal generation circuit that generates a complex signal from an input signal and the reference signal; a vector operation circuit that calculates an argument of the complex signal by performing a vector operation; and a subtracting phase comparator that compares the argument with a phase of the reference signal by calculating a difference between the argument and the phase of the reference signal, wherein the complex signal generation circuit includes: a multiplication circuit that multiplies the input signal by the reference signal; and an HPF that removes a DC component from a signal output from the multiplication circuit.
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