Circuit tracing using a focused ion beam
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United States of America Patent
Stats
-
Dec 27, 2016
Issued Date -
N/A
app pub date -
Jul 28, 2015
filing date -
Apr 24, 2013
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
Described are various embodiments of methods and systems for tracing circuitry on integrated circuits using focused ion beam based imaging techniques. In one such embodiment, a method is provide for identifying functional componentry associated with a switchable power interface on an integrated circuit, wherein the switchable power interface comprises a source and a drain with a control switch therebetween, said control switch being controllable by a control signal during operation of the integrated circuit. The method comprises connecting, with deposited conductive material, the source and the drain; applying an external voltage bias to a power input of the switchable power interface via one of the source and the drain; exposing the integrated circuit to a focused ion beam; and gathering an image of the integrated circuit during exposure to determine areas of high contrast indicating functional componentry in operative connection with the switchable power interface.
First Claim
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Family
International Classification(s)
- 2015 Application Filing Year
- G21G Class
- 64 Applications Filed
- 47 Patents Issued To-Date
- 73.44 % Issued To-Date
Cited Art Landscape
Patent Citation Ranking
- 0 Citation Count
- G21G Class
- 0 % this patent is cited more than
- 9 Age
Maintenance Fees
| Fee | Large entity fee | small entity fee | micro entity fee | due date |
|---|---|---|---|---|
| 11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | Jun 27, 2028 |
