Adjusting sample holder orientation for symmetric incident beam and scattered beam geometry to compensate for refraction index related distortions
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Dec 27, 2016
Grant Date -
Apr 9, 2015
app pub date -
Sep 15, 2014
filing date -
Oct 8, 2013
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
An apparatus with an electromagnetic radiation source generates an incident-beam. A sample container accommodates a sample, receives the incident beam for interaction with the sample, and enables a scattered beam, which is to be detected, to propagate out of the sample container. An electromagnetic radiation detector detects the scattered beam which is received from the sample container. The sample container is oriented with regard to a direction of the incident beam so that an incident trajectory of the incident beam directly before propagating into the sample container up to a symmetry axis of the sample container is symmetric with a scattered trajectory of the scattered beam from the symmetry axis up to a position of the scattered beam directly after having left the sample container, such that the scattered trajectory outside of the sample container is independent of a refraction index of the sample container and of the sample.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully