Method and system for determining position and orientation of a measuring instrument
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United States of America Patent
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-
Dec 27, 2016
Grant Date -
Feb 4, 2016
app pub date -
Oct 12, 2015
filing date -
Jan 10, 2011
priority date (Note) -
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status (Latency Note)
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Abstract
A method for determining position and orientation of a first measuring instrument is disclosed. A second MI and at least one reflective target including a retroreflector unit are arranged in the vicinity of the first MI. At least one imaging module is arranged in the first MI for determining orientation thereof. The at least one imaging module in the first MI can be used in a similar manner as a tracker unit of an optical total station, by way of detecting optical radiation emitted from the second MI and reflected by the at least one TGT.
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- 9 Age
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| Fee | Large entity fee | small entity fee | micro entity fee | due date |
|---|---|---|---|---|
| 11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | Jun 27, 2028 |
