Electrical inspection of electronic devices using electron-beam induced plasma probes
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United States of America Patent
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Dec 20, 2016
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May 15, 2014
app pub date -
Jan 15, 2014
filing date -
Jul 15, 2011
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Abstract
A non-mechanical contact signal measurement apparatus includes a first conductor on a structure under test and a gas in contact with the first conductor. At least one electron beam is directed into the gas so as to induce a plasma in the gas where the electron beam passes through the gas. A second conductor is in electrical contact with the plasma. A signal source is coupled to an electrical measurement device through the first conductor, the plasma, and the second conductor when the plasma is directed on the first conductor. The electrical measurement device is responsive to the signal source.
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