Handling system for testing electronic components
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United States of America Patent
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Dec 13, 2016
Grant Date -
Aug 15, 2013
app pub date -
Jan 30, 2013
filing date -
Feb 10, 2012
priority date (Note) -
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status (Latency Note)
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Abstract
A handling system for testing electronic components comprises a rotary turret and pick heads mounted on the rotary turret, each pick head being configured to hold a respective electronic component provided by a supply source. A carrier system which is positionable adjacent to the rotary turret is configured to carry a plurality of electronic components. The carrier system is receivable by a testing station that is operative to simultaneously test a plurality of the electronic components which have been arranged on the carrier system. The pick heads or other transfer mechanism may transfer the electronic components onto the carrier system prior to testing the same at the testing station and remove electronic components from the carrier system after testing the same at the testing station.
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