Method for inspecting electronic device and electronic device inspection apparatus

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United States of America Patent

PATENT NO 9513313
APP PUB NO 20140139253A1
SERIAL NO

14125562

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Abstract

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A method for inspecting an electronic device, in which inspection of electrical characteristics is carried out, uses conduction to pass a current to an electronic device while the electronic device is being continuously conveyed.

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Patent Owner(s)

Patent OwnerAddress
MERCK PATENT GMBHGERMANY

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Arita, Hiroaki Fuchu, JP 32 203
Masuda, Osamu Machida, JP 32 200

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