Plasma processing apparatus and plasma processing method
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United States of America Patent
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Nov 22, 2016
Grant Date -
May 28, 2015
app pub date -
Jan 30, 2015
filing date -
Nov 27, 2012
priority date (Note) -
In Force
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Abstract
A plasma processing apparatus includes a processing chamber which plasma-processes a sample, a first high-frequency power supply which supplies first high-frequency power for plasma generation to the processing chamber, a second high-frequency power supply which supplies second high-frequency power to a sample stage on which the sample is placed and a pulse generation device which generate first pulses for time-modulating the first high-frequency power and second pulses for time-modulating the second high-frequency power. The pulse generation device includes a control device which controls the first and second pulses so that frequency of the first pulses is higher than frequency of the second pulses and the on-period of the second pulse is contained in the on-period of the first pulse.

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Patent Owner(s)
Patent Owner | Address | |
---|---|---|
HITACHI HIGH-TECH CORPORATION | 17-1 TORANOMON 1-CHOME MINATO-KU TOKYO 1056409 ?1056409 |
International Classification(s)

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- [Patents Count]
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Kanazawa, Shunsuke | Kudamatsu, JP | 4 | 35 |
Morimoto, Michikazu | Kudamatsu, JP | 24 | 248 |
Ohgoshi, Yasuo | Kudamatsu, JP | 27 | 498 |
Yasui, Naoki | Kudamatsu, JP | 52 | 1457 |
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11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | May 22, 2028 |
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Surcharge - 11.5 year - Late payment within 6 months | $160.00 | $80.00 | $40.00 |
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