Automated nital etch inspection system
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United States of America Patent
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Nov 22, 2016
Grant Date -
Jul 9, 2015
app pub date -
Jan 3, 2014
filing date -
Jan 3, 2014
priority date (Note) -
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Abstract
A system and method to inspect flaws associated with a part. The system includes a first image capturing device configured to capture a first set of images of the part and a computer operably associated with first image capturing device and configured to receive and analyze the first set of images. The method includes treating the part with a nital etchant solution, capturing a first set of images of an outer surface of the part with the first image capturing device, and identifying a part defect with an algorithm associated with the computer.
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