Measurement tool for server rack
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Nov 15, 2016
Grant Date -
N/A
app pub date -
Sep 29, 2015
filing date -
Sep 29, 2015
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A structure for measuring server rack dimensions. The structure may include; a center spacer having a slider opening; a top panel fixed to a top surface of the center spacer; a bottom panel fixed to a bottom surface of the center spacer; and a slider in the slider opening of the center spacer, wherein a portion of the slider is between the top panel and the bottom panel, and the slider is horizontally movable between a starting position and an extended position, the starting position is where the slider is closest to the center of the center spacer and the extended position is where the slider is farthest from the center of the center spacer.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully