Plasma apparatus and method of fabricating semiconductor device using the same
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United States of America Patent
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Nov 8, 2016
Grant Date -
Nov 12, 2015
app pub date -
Apr 29, 2015
filing date -
May 12, 2014
priority date (Note) -
In Force
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Abstract
A plasma apparatus includes a process chamber having an inner space, a chuck disposed in the process chamber and having a top surface on which a substrate is loaded, a gas supply unit supplying a process gas into the process chamber, a plasma generating unit generating plasma over the chuck, and a direct current (DC) power generator applying a DC pulse signal to the chuck. A period of the DC pulse signal may include a negative pulse duration during which a negative pulse is applied, a positive pulse duration during which a positive pulse is applied, and a pulse-off duration during which the negative pulse and the positive pulse are turned off. The positive pulse duration is between the negative pulse duration and the pulse-off duration. The pulse-off duration may comprise a voltage having a lower magnitude than the voltage of the positive pulse, such as a ground voltage.

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- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
SAMSUNG ELECTRONICS CO LTD | GYEONGGI DO SOUTH KOREA GYEONGGI-DO |
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- [Patents Count]
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Kim, Bongseong | Yongin-si, KR | 6 | 194 |
Kim, Moojin | Suwon-si, KR | 9 | 277 |
Koo, DeogJa | Yongin-si, KR | 1 | 108 |
Lee, Unjoo | Seoul, KR | 2 | 190 |
Woo, Je-Hun | Suwon-si, KR | 8 | 170 |
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