Automatic microscopic focus system and method for analysis of transparent or low contrast specimens
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United States of America Patent
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Nov 8, 2016
Grant Date -
Mar 6, 2014
app pub date -
Aug 31, 2012
filing date -
Aug 31, 2012
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Abstract
A microscope system and method empirically determines the boundaries of the depth of field of an objective lens. The system and method are largely automated, with the manipulation of a specimen to be imaged being carried out by processors and associated equipment. Calculations of the empirical depth of field are also likewise automated. Upon empirically determining the boundaries of the depth of field, the specimen, particularly when transparent or translucent, can be accurately imaged at user-defined depths smaller than the depth of field.
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